ELECTRONICS RECYCLING SUMMIT® - 2006

Presentations

SUMMIT SESSION 1

INDUSTRY DATA AND TRENDS

Moderator: Buddy Graham, Polymer Alliance Zone, Inc.

Introduction

Highlights of the IAER Electronics Recycling Industry Report – 2006

             John Powers, Integrated Solutions & Services

Update On Data Collection Effort, Trends Seen So Far

             Jason Linnell, NCER

Certification Process Update  

             Bob Tonetti, EPA

EPA Baseline Data Effort  

            Clare Lindsay, EPA                                                           

Overall Recycling Industry Trends, International Impacts

            Walter Alcorn, Alcorn Consulting

California Program

            Matt McCarron, CIWMB

 

SUMMIT SESSION 2

RECYCLING OF WIRELESS DEVICES

Moderator: Marc Leff, GRC Wireless Recycling, Inc.

Industry Presentations

The Economics of Wireless Recycling

            Craig Boswell, Hobi International

Collection Method – Nonprofits

            Marc Leff, GRC Wireless Recycling

Collection Method – Carrier/Retail/Manufacturer models

           Craig Boswell, Hobi International

Collection Method – Consumer

            James Mosieur, RMS Communications

Processing

            Jenifer Chambers, Recellular

Regulatory issues

            Bob Tonetti, US EPA



SUMMIT SESSION 3

COLLECTION  PROGRAMS

Moderator: Jason Linnell, NCER

California Collection Program

          Shirley Willd-Wagner, CIWMB

Washington Collection Program

          Sego Jackson, Snohomish County, WA

Alberta’s Collection Program

          Doug Wright, Alberta Recycling Management Authority

Maine Collection Program

         Carole Cifrino, Maine Department of Environmental Protection

Third Party Research Overview

       (i.e. NWTPO project, how it affects collection programs)

        Jason Linnell, NCER

 

SUMMIT SESSION 4

INDUSTRY PERSPECTIVE

Moderator: Jerry Powell

E recyclers: "Improve Infrastructure Efficiencies:
Lower Your Cost or Lose Your Market Share to Someone Who Will"

       Peter Muscanelli, President, IAER


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